Mixed-Signal Test
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Tessent SerdesTest
Tessent® SerdesTest provides complete, parametric, embedded test for multi-Gb/s SerDes. It measures waveshape, many types of jitter, and various jitter tolerance parameters, all in less than 200 ms, including test set-up and on-chip comparison to test limits via an IEEE 1149.1 TAP interface. |
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Tessent DefectSim
Tessent® DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect. |
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